[1] [1] E. Cuche, P. Marquet, C. Depeursinge. Simultaneous amplitude-contrast and quantitative phase-contrast microscopy by numerical reconstruction of Fresnel off-holograms［J］. Appl. Opt., 1999, 38(34): 6994～7001

[2] [2] L. Yu, M. K. Kim. Wavelength-scanning digital interference holography for tomographic three-dimensional imaging by use of the angular spectrum method［J］. Opt. Lett., 2005, 30(16): 2092～2094

[3] [3] I. Yamaguchi, T. Zhang. Phase-shifting digital holography［J］. Opt. Lett., 1997, 22(16): 1268～1270

[4] [4] M. Chang, Ch. P. Hu, P. Lam et al.. High precision deformation measurement by digital phase shifting holographic interferometry［J］. Appl. Opt., 1985, 24(22): 3780～3783

[5] [5] Qin Yi, Zhong Jingang. Theoretical and experiment research of digital holography with partially coherent light based on light-emitting diode［J］. Acta Optica Sinica, 2010, 30(8): 2236～2241

[6] [6] F. Charrière, J. Kühn, T. Colomb et al.. Characterization of microlenses by digital holographic microscopy［J］. Appl. Opt., 2006, 45(5): 829～835

[7] [7] T. Colomb, S. Krivec, H. Hutter et al.. Digital holographic reflectometry［J］. Opt. Express, 2010, 18(4): 3719～3731

[8] [8] T. Zhang, I. Yamaguchi. Three-dimensional microscopy with phase-shifting digital holography［J］. Opt. Lett., 1998, 23(15): 1221～1223

[9] [9] I. Yamaguchi, T. Ida, M. Yokota et al.. Surface shape measurement by phase-shifting digital holography with a wavelength shift［J］. Appl. Opt., 2006, 45(29): 7610～7616

[10] [10] I. Yamaguchi, S. Ohta, J. Kato. Surface contouring by phase-shifting digital holography［J］. Opt. & Lasers in Engng., 2001, 36(5): 417～428

[11] [11] C. J. Mann, L. Yu, C. Lo et al.. High-resolution quantitative phase-contrast microscopy by digital holography \[J\]. Opt. Express, 2005, 13(22): 8693～8698

[12] [12] Xie Yongjun, Shi Tielin, Liu Shiyuan et al.. Measuring dynamic characterization of micro-structures with Linnik microscopic interferometry［J］. Metrology & Measurement Technique, 2009, 36(4): 4～6

[13] [13] B. Kemper, S. Stürwald, C. Remmersmann et al.. Characterisation of light emitting diodes (LEDs) for application in digital holographic microscopy for inspection of micro and nanostructured surfaces［J］. Opt. & Lasers in Engng., 2008, 46(7): 499～507

[14] [14] N. Warnasooriya, M. K. Kim. LED-based multi-wavelength phase imaging interference microscopy［J］. Opt. Express, 2007, 15(7): 9239～9247

[15] [15] Zhang Yancao, Zhao Jianlin, Fan Qi et al.. Application of apodization digital holography in phase measurement［J］. Chinese J. Lasers, 2010, 37(6): 1602～1606