Infrared Technology, Volume. 42, Issue 7, 632(2020)

Estate Evaluation of Image Fault of Electric Power Fittings

Xu LU1... Hanwu LUO1, Wenzhen LI1, Hailong ZHANG2, Qirui WU2 and Cheng LEI3 |Show fewer author(s)
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    LU Xu, LUO Hanwu, LI Wenzhen, ZHANG Hailong, WU Qirui, LEI Cheng. Estate Evaluation of Image Fault of Electric Power Fittings[J]. Infrared Technology, 2020, 42(7): 632

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    Received: Jul. 31, 2019

    Accepted: --

    Published Online: Aug. 18, 2020

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    DOI:

    CSTR:32186.14.

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