Experimental study on evaluation of smoke interference effectiveness based on image quality

DING Jia-lin; LIU Shu-xin; ZHANG Qi; ZHANG Yuan-peng; LI Qing-wei; CHEN Chun-sheng

doi:10.3969/j.issn.1001-5078.2025.016

Laser & Infrared, Volume. 55, Issue 2, 266(2025)

Experimental study on evaluation of smoke interference effectiveness based on image quality

DING Jia-lin¹, LIU Shu-xin², ZHANG Qi¹, ZHANG Yuan-peng¹, LI Qing-wei¹, and CHEN Chun-sheng^1,3、*

Author Affiliations

¹Chemical Defense Institute, Academy of Military Sciences, Beijing 102205, China

²Southwest Institute of Technical Physics, Chengdu 610041, China

³State Key Laboratory of NBC Protection for Civilian, Beijing 102205, China

show less

Abstract Get PDF(in Chinese)

References(3)

[12] [12] YUE Guanghui, WU Honglv, JIANG Qiuping, et al. Perceptual quality assessment of retouched face images[J]. IEEE Transactions on Multimedia, 2024, 26: 5741-5752.

[14] [14] CHEN D., DAI Q., FENG D., et al. Reverse time migration of ground penetrating radar based on normalized cross correlation imaging condition (Article)[J]. Journal of Central South University: Science and Technology, 2018, 49(5): 1221-1227.

[16] [16] YAO Juncai, SHEN Jing, YAO Congying. Image quality assessment based on the perceived structural similarity index of an image[J]. Math Biosci Eng, 2023, 20(5): 9385-9409.

Tools

Get Citation

Copy Citation Text

DING Jia-lin, LIU Shu-xin, ZHANG Qi, ZHANG Yuan-peng, LI Qing-wei, CHEN Chun-sheng. Experimental study on evaluation of smoke interference effectiveness based on image quality[J]. Laser & Infrared, 2025, 55(2): 266

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Category:

Received: May. 9, 2024

Accepted: Apr. 3, 2025

Published Online: Apr. 3, 2025

The Author Email: CHEN Chun-sheng (ccs113@126.com)

DOI:10.3969/j.issn.1001-5078.2025.016

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology