Screen printing of upconversion NaYF4:Yb3+/Eu3+ with Li+ doped for anti-counterfeiting application

Dongdong Li; Jianye Mo; Chong Wang; Wei Liu; Haibo Ge; Dongdong Han; Aihua Hao; Baoyu Chai; Jiangbo She

doi:10.3788/COL202018.110501

Chinese Optics Letters, Volume. 18, Issue 11, 110501(2020)

Screen printing of upconversion NaYF₄:Yb³⁺/Eu³⁺ with Li⁺ doped for anti-counterfeiting application

Dongdong Li¹, Jianye Mo¹, Chong Wang¹, Wei Liu¹, Haibo Ge¹, Dongdong Han¹, Aihua Hao¹, Baoyu Chai¹, and Jiangbo She^2、*

Author Affiliations

¹School of Electronic Engineering, Xi’an University of Post & Telecommunications, Xi’an 710121, China

²State Key Laboratory of Transient Optics and Photonics, Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi’an 710119, China

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Figures & Tables(8)

$XRD diffraction pattern of Li+-doped NaYF4:18%Yb3+, 2%Eu3+.$

Fig. 1. XRD diffraction pattern of ${Li}^{+}$ -doped ${NaYF}_{4} : 18 % {Yb}^{3 +}$ , 2% ${Eu}^{3 +}$ .

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$Diffraction peak of Li+-doped NaYF4:18%Yb3+, 2% Eu3+ UCMPs around 43.472°.$

Fig. 2. Diffraction peak of ${Li}^{+}$ -doped ${NaYF}_{4} : 18 % {Yb}^{3 +}$ , 2% ${Eu}^{3 +}$ UCMPs around 43.472°.

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Fig. 3. SEM images of ${Li}^{+}$ -doped ${NaYF}_{4} : 18 % {Yb}^{3 +}$ , 2% ${Eu}^{3 +}$ .

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Fig. 4. Schematic diagram of energy level transition of ${Li}^{+}$ -doped ${NaYF}_{4} : 18 % {Yb}^{3 +}$ , 2% ${Eu}^{3 +}$ .

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Fig. 5. Fluorescence spectra of ${Li}_{x} {Na}_{1 - x} {YF}_{4} : 18 % {Yb}^{3 +}$ , 2% ${Eu}^{3 +}$ with different Li ion doping concentrations.

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Fig. 6. CIE of ${Li}^{+}$ -doped ${NaYF}_{4} : 18 % {Yb}^{3 +}$ , 2% ${Eu}^{3 +}$ .

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Fig. 7. Screen printing imaging process.

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Fig. 8. Screen printing imaging results of different materials. (a) Plastic, (b) optical disc, (c) glass, (d) printing table.

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Dongdong Li, Jianye Mo, Chong Wang, Wei Liu, Haibo Ge, Dongdong Han, Aihua Hao, Baoyu Chai, Jiangbo She, "Screen printing of upconversion NaYF₄:Yb³⁺/Eu³⁺ with Li⁺ doped for anti-counterfeiting application," Chin. Opt. Lett. 18, 110501 (2020)

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Paper Information

Category: Diffraction, Gratings, and Holography

Received: Jun. 3, 2020

Accepted: Jul. 7, 2020

Published Online: Sep. 27, 2020

The Author Email: Jiangbo She (shejb@opt.ac.cn)

DOI:10.3788/COL202018.110501

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology