Chinese Optics Letters, Volume. 7, Issue 3, 03263(2009)
Annealing induced refinement on optical transmission and electrical resistivity of indium tin oxide
[1] [1] S. A. Carter, M. Angelopoulos, S. Karg, P. J. Brock, and J. C. Scott, Appl. Phys. Lett. 70, 2067 (1997).
[2] [2] F. Li, H. Tang, J. Shinar, O. Resto, and S. Z. Weisz, Appl. Phys. Lett. 70, 2741 (1997).
[3] [3] J. Plá, M. Tamasi, R. Rizzoli, M. Losurdo, E. Centurioni, C. Summonte, and F. Rubinelli, Thin Solid Films 425, 185 (2003).
[4] [4] D.-H. Kim, M.-R. Park, and G.-H. Lee, Surf. Coat. Technol. 201, 927 (2006).
[5] [5] A. De, P. K. Biswas, and J. Manara, Mater. Character. 58, 629 (2007).
[6] [6] D. Kim, Y. Han, J.-S. Cho, and S.-K. Koh, Thin Solid Films 377—378, 81 (2000).
[7] [7] A. Khodorov, M. Piechowiak, and M. J. M. Gomes, Thin Solid Films 515, 7829 (2007).
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Wei-Lun Hsu, Cheng-Tao Lin, Tzu-Huan Cheng, Shih-Chiang Yen, Chee-Wee Liu, Din Ping, Gong-Ru Lin, "Annealing induced refinement on optical transmission and electrical resistivity of indium tin oxide," Chin. Opt. Lett. 7, 03263 (2009)
Received: Sep. 16, 2008
Accepted: --
Published Online: Mar. 20, 2009
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