[1] [1] Chen F, Brown G M, Song M. Overview of three-dimensional shape measurement using optical methods. Opt. Engng., 2000, 39(1):10～22

[2] [2] Srinivasan V, Liu H C, Halioua M. Automated phase-measuring profilometry of 3-D diffuse object. Appl. Opt., 1984, 23(l8):3l05～3l08

[3] [3] Su X Y, Bally G V, Vukicevic D. Phase-stepping grating profilometry: Utilization of intensity modulation analysis in complex objects evaluation. Opt. Commun., 1993, 98(1):141～150

[6] [6] Srinivasan V, Liu H C, Halioua M. Automated phase-measuring profilometry: A phase mapping approach. Appl. Opt., 1985, 24(2):185～188

[7] [7] Sansoni G, Carocci M, Rodella R. Three dimensional vision based on a combination of gray-code and phase-shift light projection: Analysis and compensation of the systematic errors. Appl. Opt., 1999, 38(31):6565～6573

[8] [8] Zhou W S, Su X Y. A direct mapping algorithm for phase-measuring profilometry. J. Mod. Opt., 1994, 41(1):89～94

[9] [9] Schonfeld H, Hausler G, Karbacher S. Reverse engineering using optical 3D sensors. Proc. SPIE, 1998, 3313:115～125

[10] [10] Asundi A, Zhou W S. Unified calibration technique and its applications in optical triangulation profilometry. Appl. Opt., 1999, 38(16):3556～3561

[11] [11] Xue L, Su X Y. Phase-unwrapping algorithm based on frequency analysis for measurement of a complex object by the phase-measuring profilometry method. Appl. Opt., 2001, 40(8):1207～1215

[12] [12] Canny J F. A computational approach to edge detection. IEEE Trans. Pattern Analysts and Machine Intelligence, 1986, 8(6):679～698

[13] [13] Devernay F. A non-maxima suppression method for edge detection with sub-pixel accuracy. Technical Report 2724, INRIA (Nov. 1995). http://www.inrio.fr/index.en.html

[14] [14] Fitzgibbon A W, Pilu M, Fisher R B. Direct least-squares fitting of ellipses. IEEE Trans. Pattern Analysts and Machine Intelligence, 1999, 21(5):476～480