High Power Laser and Particle Beams, Volume. 31, Issue 6, 66001(2019)
Total dose effect of HfO2 based MOS capacitors under gamma-ray radiation
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Ding Man. Total dose effect of HfO2 based MOS capacitors under gamma-ray radiation[J]. High Power Laser and Particle Beams, 2019, 31(6): 66001
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Received: Nov. 19, 2018
Accepted: --
Published Online: Jun. 17, 2019
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