Chinese Optics Letters, Volume. 21, Issue 6, 061101(2023)

Compact in situ microscope for photoelectron spectroscopy via two-mirror reflection

Chenyang Yue1,2,3, Hong Jiang1, Tianzhi Li1,4, Siyan Yao1,2, Shengyue Zeng1, Xiaojun Xu1,2,3, and Chaofan Zhang1,4、*
Author Affiliations
  • 1College of Advanced Interdisciplinary Studies, National University of Defense Technology, Changsha 410073, China
  • 2State Key Laboratory of Pulsed Power Laser Technology, Changsha 410073, China
  • 3Hunan Provincial Key Laboratory of High Energy Laser Technology, Changsha 410073, China
  • 4Nanhu Laser Laboratory, National University of Defense Technology, Changsha 410073, China
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    References(18)

    [8] J. Zach, M. Haider. Correction of spherical and chromatic aberration in a low voltage SEM. Optik, 98, 112(1995).

    [18] M. Corbett, N. Maycock, E. Rosen, D. O’Brart. Scheimpflug camera-based systems. Corneal Topography: Principles and Applications, 43(2019).

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    Chenyang Yue, Hong Jiang, Tianzhi Li, Siyan Yao, Shengyue Zeng, Xiaojun Xu, Chaofan Zhang, "Compact in situ microscope for photoelectron spectroscopy via two-mirror reflection," Chin. Opt. Lett. 21, 061101 (2023)

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    Paper Information

    Category: Imaging Systems and Image Processing

    Received: Aug. 25, 2022

    Accepted: Apr. 4, 2023

    Published Online: Jun. 7, 2023

    The Author Email: Chaofan Zhang (c.zhang@nudt.edu.cn)

    DOI:10.3788/COL202321.061101

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