Fig. 1. Structure of the desktop micro-X-ray diffractometer (μ-Hawk) focused by polycapillary optics.台式毛细管聚焦的微束X射线衍射仪(μ-Hawk)结构示意图

Fig. 2. Automatic control flow chart of μ-Hawk.μ-Hawk自动化控制流程图

Fig. 3. Main interface of controlling program of μ-Hawk and the X-ray diffraction pattern of Si (4 0 0).μ-Hawk控制程序的主界面与Si (4 0 0)的X射线衍射图

Fig. 4. X-ray scattering spectra with and without Ni filter.有Ni吸收片和无Ni吸收片两种条件下的X射线散射谱

Fig. 5. (a) Gaussian fitting peak and (b) data scatter diagram of measured Si (4 0 0) diffraction peak when the receiving slit size is 0.1 mm, and the distances between the sample and the detector are varied; (c) gaussian fitting peak and (d) data scatter diagram of measured Si (4 0 0) diffraction peak when the distance between the sample and the detector is 70 mm, receiving slit sizes are varied.在接收狭缝宽度为0.1 mm, 样品和探测器之间不同距离条件下测得Si (4 0 0)衍射峰的(a)高斯拟合峰和(b)数据散点图; 在样品和探测器之间距离为70 mm, 不同接收狭缝宽度条件下测得Si (4 0 0)衍射峰的(c)高斯拟合峰和(d)数据散点图

Fig. 6. The RMB 5 Jiao coin and the detected point.人民币5角硬币以及待测点示意图

Fig. 7. Micro-X-ray fluorescence spectrum of the coin.硬币的微区X射线荧光谱

Fig. 8. Diffraction patterns measured by μ-Hawk and X-pert-pro-MPD diffractometer of the coin.μ-Hawk和X-pert-pro-MPD两种衍射仪测量硬币的衍射图

Fig. 9. Copper wire with a diameter of 140 μm and the detected point.直径为140 μm的铜导线以及待测点示意图

Fig. 10. Micro-X-ray diffraction pattern of copper wire with a diameter of 140 μm.直径140 μm铜导线的X射线衍射图

Fig. 11. Picture of one welding joint on the motherboard of an iPhone and the detected area.苹果手机主板上某焊锡接触点以及探测区域示意图

Fig. 12. Micro-X-ray fluorescence spectrum of the welding joint.焊锡接触点的微区X射线荧光谱

Fig. 13. Micro-X-ray diffraction pattern of the welding joint.焊锡接触点的微区X射线衍射图

Fig. 14. Phase mapping in 1.0 mm × 0.6 mm area of SnO₂(3 1 2) in the welding joint. 焊锡接触点中SnO₂(3 1 2)在1.0 mm × 0.6 mm区域内的物相分布图