Laser & Optoelectronics Progress, Volume. 53, Issue 11, 111201(2016)

Measurement of 2.52 THz Back Scattering in Aluminium Plates with Four Kinds of Roughness

Fan Changkun*, Li Qi, Zhou Yi, Zhao Yongpeng, and Chen Deying
Author Affiliations
  • [in Chinese]
  • show less
    Figures & Tables(0)
    Tools

    Get Citation

    Copy Citation Text

    Fan Changkun, Li Qi, Zhou Yi, Zhao Yongpeng, Chen Deying. Measurement of 2.52 THz Back Scattering in Aluminium Plates with Four Kinds of Roughness[J]. Laser & Optoelectronics Progress, 2016, 53(11): 111201

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Jul. 12, 2016

    Accepted: --

    Published Online: Nov. 14, 2016

    The Author Email: Fan Changkun (hit_fanchangkun@qq.com)

    DOI:10.3788/lop53.111201

    Topics