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Laser & Optoelectronics Progress, Volume. 53, Issue 9, 93001(2016)

Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy

Wang Qin1,2、*, Zhao Chang1,2, Yang Huinan1,2, Su Mingxu1,2, and Cai Xiaoshu1,2
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    Article index updated: Sep. 15, 2025

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    Wang Qin, Zhao Chang, Yang Huinan, Su Mingxu, Cai Xiaoshu. Simultaneous Measurement of Film Thickness and Mass Fraction by Raman Spectroscopy[J]. Laser & Optoelectronics Progress, 2016, 53(9): 93001

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    Paper Information

    Category: Spectroscopy

    Received: Apr. 11, 2016

    Accepted: --

    Published Online: Sep. 14, 2016

    The Author Email: Wang Qin (usst_wangqin@163.com)

    DOI:10.3788/lop53.093001

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology