Digital holographic microscopy applied to 3D computer micro-vision by using deep neural networks

Stéphane Cuenat; Jesús E. Brito Carcaño; Belal Ahmad; Patrick Sandoz; Raphaël Couturier; Guillaume J. Laurent; Maxime Jacquot

doi:10.1051/jeos/2024032

Journal of the European Optical Society-Rapid Publications, Volume. 20, Issue 1, 2024032(2024)

Digital holographic microscopy applied to 3D computer micro-vision by using deep neural networks

Stéphane Cuenat, Jesús E. Brito Carcaño, Belal Ahmad, Patrick Sandoz, Raphaël Couturier, Guillaume J. Laurent, and Maxime Jacquot^*

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References(9)

[1] S. Yao, H. Li, S. Pang, B. Zhu, X. Zhang, S. Fatikow. IEEE Trans. Instrum. Meas., 70, 1-28(2021).

[2] S. Cuenat, L. Andréoli, A.N. André, P. Sandoz, G.J. Laurent, R. Couturier, M. Jacquot. Opt. Express, 30, 14(2022).

[3] L. Huang, H. Chen, T. Liu et al. Self-supervised learning of hologram reconstruction using physics consistency. Nat. Mach. Intell., 5, 895-907(2023).

[4] [4] RonnebergerO., FischerP., BroxT. (2015) arxiv. 1505.04597.

[5] T. Zeng, Y. Zhu, E.Y. Lam. Opt. Express, 29, 24(2021).

[6] A.N. André, P. Sandoz, B. Mauzé, M. Jacquot, G.J. Laurent. Int. J. Comput. Vis., 130, 6(2022).

[7] A.N. André, P. Sandoz, B. Mauzé, M. Jacquot, G.J. Laurent. EEE/ASME Trans. Mech., 25, 1193-1201(2020).

[8] J.W. Goodman. Introduction to fourier optics, 55-61(2005).

[9] [9] LiuX., DiX. (2020) arxiv. 2003.09855.

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Stéphane Cuenat, Jesús E. Brito Carcaño, Belal Ahmad, Patrick Sandoz, Raphaël Couturier, Guillaume J. Laurent, Maxime Jacquot. Digital holographic microscopy applied to 3D computer micro-vision by using deep neural networks[J]. Journal of the European Optical Society-Rapid Publications, 2024, 20(1): 2024032

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Paper Information

Category: Research Articles

Received: Jan. 31, 2024

Accepted: Jun. 13, 2024

Published Online: Dec. 16, 2024

The Author Email: Maxime Jacquot (maxime.jacquot@univ-fcomte.fr)

DOI:10.1051/jeos/2024032

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology