Fig. 1. Normalized squared e-field intensity distribution in the outer thirteen layers of the HfO2/SiO2 coatings.

Fig. 2. (a) Damage probability fitted curve under different shot numbers. (b) The variation of damage threshold of 0% and 100% probability with the shot numbers.

Fig. 3. (a) Average damage threshold distribution. (b) Threshold standard deviation versus the shot numbers.

Fig. 4. Defect density versus the shot numbers.

Fig. 5. Defect density distribution versus the intrinsic threshold with different shot numbers ranging from 1 to 1000.