[1] FRANDOLI D, D'ACUNZO M, HADA D et al. Advanced screen printing: application on MicroLED tiled display[J]. Journal of the Society for Information Display, 30, 263-270(2022).

[2] WU M C, CHUNG M C, WU C Y. 3200 ppi matrix-addressable blue MicroLED display[J]. Micromachines, 13, 1350(2022).

[3] LI S B, SONG B F, PETERSON T et al. MicroLED chromatic confocal microscope[J]. Optics Letters, 46, 2722-2725(2021).

[4] CHEN Z, YAN S K, DANESH C. MicroLED technologies and applications: characteristics, fabrication, progress, and challenges[J]. Journal of Physics D: Applied Physics, 54, 123001(2021).

[5] HUANG Y G, HSIANG E L, DENG M Y et al. Mini-LED, Micro-LED and OLED displays: present status and future perspectives[J]. Light: Science & Applications, 9, 105(2020).

[6] LIU Z J, LIN C H, HYUN B R et al. Micro-light-emitting diodes with quantum dots in display technology[J]. Light: Science & Applications, 9, 83(2020).

[7] QUERCETO S, FERRANTINI C, GRANDINETTI B et al. MicroLED illumination towards liquid crystalline elastomers based cardiac contraction assistance[J]. Biophysical Journal, 118, 424a-425a(2020).

[8] ZHAO Q Q, ZHOU J, TIAN M. A wafer testing system and wafer testing method[P].

[9] DU T M. A wafer testing system and wafer testing method[P].

[10] ZHU H, LIU G X. A test method of mini LED and micro LED[P].

[11] CHEN D. Predicting LED parameters from electroluminescent semiconductor wafer testing[P].

[12] PENG L, WU X L, ZHAO J H et al. A test method to improve the appearance yield of GaN based LED chips[P].

[13] SHIM J I, HAN D P, SHIN D S. Wafer-Level electroluminescence metrology for InGaN light-emitting diodes[J]. IEEE Journal of Quantum Electronics, 52, 3300406(2016).

[14] LIN J S, LIN H Y, PENG Y C et al. Detection method and detection device for wafer level led chips and transparent probe card thereof[P].

[15] JIN X. A micro LED test system[P].

[16] SHEN L Y, DONG M S, ZHANG J Y et al. An LED testing system[P].

[17] ZHENG L L, GUO Z Q, YAN W et al. Research on a camera-based microscopic imaging system to inspect the surface luminance of the micro-led array[J]. IEEE Access, 6, 51329-51336(2018).

[18] LIU Y X, MA J F, XIA K. A micro LED intelligent crimping illumination detection device and its detection method[P].

[19] ZHENG L L, LIN Z Y. MicroLED test fixture and MicroLED test equipment[P].

[20] REMES K, FABRITIUS Y. Non-contact characterization of flexible hybrid electronics by synchronized thermography[J]. IEEE Transactions on Instrumentation and Measurement, 69, 2390-2397(2020).

[21] ZHANG K. A. Mini/MicroLED lighting test device[P].

[22] ZHANG K, LUO X K, YE Y H et al. A Mini/MicroLED multi-channel integrated detection test device[P].

[23] ZHANG Y W, ZHOU Y, ZHU C P et al. A MicroLED detection and transfer method[P].

[24] KIM H T, KIM J, KIM S et al. A dual side electroluminescence measurement system for LED wafer manufacturing[J]. Recent Patents on Signal Processing, 3, 49-55(2013).

[25] CAO Z F, YAN B H, XIA W et al. A non-destructive testing method for LED chips[P].

[26] DAIBO M, KAMIWANO D, KUROSAWA T et al. Ultraviolet laser SQUID microscope for GaN blue light emitting diode testing[J]. Journal of Physics: Conference Series, 43, 1262-1265(2006).

[27] BEHRMAN K, FOUILLOUX J, IRELAND T et al. Early defect identification for micro light-emitting diode displays via photoluminescent and cathodoluminescent imaging[J]. Journal of the Society for Information Display, 29, 264-274(2021).

[28] CAI Z D. LED wafer detection device and method[P].

[29] WU Y F, WEN Y M, LI P et al. Online non-contact fault detection system for LED chip during packaging[J]. Chinese Journal of Sensors and Actuators, 21, 1061-1065(2008).

[30] WEN J, WEN Y M, LI P et al. Test method for the electrical characteristics of LED based on photo excitation and photo detection[J]. Journal of Optoelectronics·Laser, 22, 1051-1056(2011).

[31] CHANG C Y, CHANG C H, LI C H et al. Learning vector quantization neural networks for LED wafer defect inspection[C], 229(2007).

[32] CHANG C Y, CHANG C W, LIN S Y et al. Integrated two hopfield neural networks for automatic led defect inspection[J]. Journal of the Chinese Society of Mechanical Engineers, Series C: Transactions of the Chinese Society of Mechanical Engineers, 29, 45-51(2008).

[33] GUO Z F, GUAN T. A method for measuring photoelectric properties of LED crystal[P].

[34] CHANG C Y, LI C H, LIN S Y et al. Application of two Hopfield neural networks for automatic four-element LED inspection[J]. IEEE Transactions on Systems, Man, and Cybernetics, Part C (Applications and Reviews), 39, 352-352(2009).

[35] LIN H D. Automated defect inspection of light-emitting diode chips using neural network and statistical approaches[J]. Expert Systems with Applications, 36, 219-226(2009).

[36] PAN Z L, CHEN L, ZHANG G Z. Defect feature acquisition of LED wafer using region growing segmentation with clustering strategy[J]. Solid State Phenomena, 181-182, 251-254(2012).

[37] SHI W, WANG J G, DONG Z M et al. The application of template matching graphic technology in LED chip testing[C], 739-741(2011).

[38] CHANG C Y, LI C H, CHANG Y C et al. Wafer defect inspection by neural analysis of region features[J]. Journal of Intelligent Manufacturing, 22, 953-964(2011).

[39] CHEN S H, TSAI C C. SMD LED chips defect detection using a YOLOv3-dense model[J]. Advanced Engineering Informatics, 47, 101255(2021).

[40] HUANG C H, LEE P H, CHANG S H et al. Automated optical inspection method for light-emitting diode defect detection using unsupervised generative adversarial neural network[J]. Crystals, 11, 1048(2021).

[41] WENG W H, TSAI C Y, HUNG C Y et al. Development of an adaptive template for fast detection of lithographic patterns of light-emitting diode chips[J]. The International Journal of Advanced Manufacturing Technology, 117, 3297-3321(2021).

[42] WU S H. An LED testing system[P].

[43] STERN M L, SCHELLENBERGER M. Fully convolutional networks for chip-wise defect detection employing photoluminescence images: efficient quality control in LED manufacturing[J]. Journal of Intelligent Manufacturing, 32, 113-126(2021).

[44] PUGGINI L, DOYLE J, MCLOONE S. Fault detection using random forest similarity distance[J]. IFAC-PapersOnLine, 48, 583-588(2015).

[45] SHU Y F, LI B, LIN H. Quality safety monitoring of LED chips using deep learning-based vision inspection methods[J]. Measurement, 168, 108123(2021).

[46] LI N N, HONG Z K, WANG J et al. A Micro LED color uniformity detection system[P].

[47] KUO C F J, TUNG C P, WENG W H. Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips[J]. Journal of Intelligent Manufacturing, 30, 727-741(2019).

[48] TIMM F, BARTH E. Novelty detection for the inspection of light-emitting diodes[J]. Expert Systems with Applications, 39, 3413-3422(2012).

[49] CHAI X Y, XIAO Z X, ZHU T. An ATE test and AOI test integrated detection equipment[P].

[50] ZHANG H Y, WEN S S, FANG F et al. Failure analysis of light emitting diode based on microscopic infrared hot spot location system[J]. Chinese Journal of Luminescence, 40, 1185-1191(2019).

[51] BOUSSADI Y, ROCHAT N, BARNES J P et al. Investigation of sidewall damage induced by reactive ion etching on AlGaInP MESA for micro-LED application[J]. Journal of Luminescence, 234, 117937(2021).

[52] HENLEY F J. Materials, process and production equipment considerations to achieve high-yield MicroLED mass-production[J]. SID Symposium Digest of Technical Papers, 49, 86-89(2018).

[53] GUO Q C, HOU Y Q, WANG H et al. A completely non-contact automatic detection Mini/Intelligent system of micro LED on-off[P].

[54] WU C X, CHEN R, GUO T L et al. LED chip non-contact detection device and method[P].

[55] CHEN P Q, WANG K, CHEN J J et al. Achieving wide operating voltage windows in non-carrier injection micro-LEDs for enhancing luminance robustness[J]. IEEE Transactions on Electron Devices, 69, 212-215(2022).

[56] WANG K, CHEN P Q, CHEN J J et al. Alternating current electroluminescence from GaN-based nanorod light-emitting diodes[J]. Optics & Laser Technology, 140, 107044(2021).

[57] WANG K, LIU Y, WU C X et al. Electroluminescence from μLED without external charge injection[J]. Scientific Reports, 10, 8059(2020).

[58] WU C X, WANG K, ZHANG Y A et al. Emerging nanopixel light-emitting displays: significance, challenges, and prospects[J]. The Journal of Physical Chemistry Letters, 12, 3522-3527(2021).

[59] WANG K, LIU Y, CHEN R et al. Light-pulse splitting from nano-light-emitting diodes operating in noncarrier injection mode[J]. IEEE Electron Device Letters, 42, 1033-1036(2021).

[60] LIAO Y T, LI W H, WANG K et al. TENG-inspired LED-in-capacitors for smart self-powered high-voltage monitoring and high-sensitivity demodulation of power-line communications[J]. Nano Energy, 102, 107698(2022).

[61] WU C X, WANG K, GUO T L. Theoretical study of LED operating in noncarrier injection mode[J]. Nanomaterials, 12, 2532(2022).