Opto-Electronic Engineering, Volume. 44, Issue 7, 744(2017)

I-V characteristic test and curve fitting of high-altitude solar cell

Yuyan Zhang1, Yong Liu1, Yintang Wen2, and Xiaoyuan Luo1
Author Affiliations
  • 1Institute of Electrical Engineering, Yanshan University, Qinhuangdao 066004, China
  • 2Institute of Defense Science and Technology, Yanshan University, Qinhuangdao 066004, China
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    Yuyan Zhang, Yong Liu, Yintang Wen, Xiaoyuan Luo. I-V characteristic test and curve fitting of high-altitude solar cell[J]. Opto-Electronic Engineering, 2017, 44(7): 744

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    Received: --

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    Published Online: Nov. 27, 2017

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    CSTR:32186.14.

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