Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO<sub>4</sub> laser

Weiping Wang; Yidong Tan; Shulian Zhang; Yan Li

doi:10.3788/COL201513.121201

Chinese Optics Letters, Volume. 13, Issue 12, 121201(2015)

Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO₄ laser

Weiping Wang, Yidong Tan, Shulian Zhang^*, and Yan Li

Department of Precision Instrument, State Key Lab of Precision Measurement Technology and Instrument, Tsinghua University, Beijing 100084, China

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Weiping Wang, Yidong Tan, Shulian Zhang, Yan Li, "Microstructure measurement based on frequency-shift feedback in a-cut Nd:YVO₄ laser," Chin. Opt. Lett. 13, 121201 (2015)

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Paper Information

Category: Instrumentation, measurement, and metrology

Received: Aug. 11, 2015

Accepted: Oct. 27, 2015

Published Online: Sep. 12, 2018

The Author Email: Shulian Zhang (zsl@mails.tsinghua.edu.cn)

DOI:10.3788/COL201513.121201

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology