Fig. 1. Structured light imaging system model

Fig. 2. Common types of a set of sequence points on the captured fringe images. (a) A series of stripe images obtained through a 4-step phase shift; (b) normalized distributions of four common sequence point types from Fig. 2(a) relative to the ideal cosine curve

Fig. 3. Phase invalid point removal process of the proposed algorithm

Fig. 4. Gypsum sculpture data modulation results. (a) Stripe pattern； (b) data modulation pattern

Fig. 5. Structured light measurement system

Fig. 6. Physical images of the experimental object (rectangular box indicates the selected phase positions in Table 1). (a) Gypsum sculpture; (b) circuit board

Fig. 7. Gypsum sculpture's absolute phase values of the 1500th column. (a) Phase value before correction; (b) phase value after correction

Fig. 8. Experimental object phase maps.(a) Absolute phase of gypsum sculpture before correction; (b) absolute phase of gypsum sculpture after correction by the method of reference [11]; (c) absolute phase of gypsum sculpture after correction by the method of reference [13]; (d) absolute phase of gypsum sculpture after correction by the proposed method; (e) absolute phase of circuit board before correction; (f) absolute phase of circuit board after correction by the method of reference [11]; (g) absolute phase of circuit board after correction by the method of reference [13]; (h) absolute phase of circuit board after correction by the proposed method

Fig. 9. Experimental object point cloud images: (a) Point cloud of gypsum sculpture before correction; (b) point cloud of gypsum sculpture after correction by the method of reference [11]; (c)point cloud of gypsum sculpture after correction by the method of reference [13]; (d) point cloud of gypsum sculpture after correction by the proposed method; (e) point cloud of circuit board before correction; (f) point cloud of circuit board after correction by the method of reference [11]; (g) point cloud of circuit board after correction by the method of reference [13]; (h) point cloud of circuit board after correction by the proposed method