Metrology & Measurement Technology, Volume. 45, Issue 3, 100(2025)

State of the art and perspectives of metrology technologies for low⁃altitude aircraft navigation systems

Zhe FAN*, Fengyuan YU, and Jianbo ZHAO
Author Affiliations
  • AVIC Changcheng Institute of Metrology & Measurement, Beijing100095, China
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    Figures & Tables(13)
    Satellite navigation system
    Inertial navigation system
    Low⁃altitude aircraft navigation system⁃level metrology techniques
    Low⁃altitude aircraft navigation instrument⁃level metrology techniques: accelerometer
    Low⁃altitude aircraft navigation instrument⁃level metrology techniques: gyroscope
    Low⁃altitude aircraft navigation environmental adaptability metrology techniques
    Static position and velocity testing device for navigation systems
    Vehicle⁃mounted standard testing device
    Simulation testing device for position and velocity of navigation systems
    Heading static testing system
    Heading angle dynamic testing device
    Attitude angle testing device for navigation systems
    Five⁃axis angular motion testing device
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    Zhe FAN, Fengyuan YU, Jianbo ZHAO. State of the art and perspectives of metrology technologies for low⁃altitude aircraft navigation systems[J]. Metrology & Measurement Technology, 2025, 45(3): 100

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    Paper Information

    Category: Sensor Technology

    Received: Jan. 2, 2025

    Accepted: --

    Published Online: Jul. 31, 2025

    The Author Email:

    DOI:10.11823/j.issn.1674-5795.2025.03.09

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