Chinese Optics Letters, Volume. 23, Issue 8, 082201(2025)
Ultra-precision manufacturing technology for a 32-channel image slicer for IFS of CSST
Figures & Tables(16)
![Three schematic diagrams illustrating the operational modes of IFU[5].](/Images/icon/loading.gif){kind=icon}
Fig. 1. Three schematic diagrams illustrating the operational modes of IFU[5].
Fig. 3. Sketch of the proposed stacking, polishing, and pushing method.
Fig. 4. Schematic of fabrication process. (a) Rectangular thin glass of different lengths; (b) rectangular thin glass stack; (c) glue ladder pattern blocks to auxiliary parts, which are used for spherical fabrication; (d) fabricate a sphere on the front surface; (e) stack glass slices in reverse direction; (f) cut the useless parts and combine them with molecular adhesion.
Fig. 5. Relationship between
Fig. 7. Relationship between the number of bonding layers, adsorption energy, and PV.
Fig. 9. Schematic diagram depicts the tooling used for stacking glass sheets.
Fig. 10. Diagram of the optical path used to detect the image slicer tilt error.
Fig. 13. Surface topography of the image slicer including non-working area analyzed by the white-light interferometer.
Table 1. Fundamental Parameters of the IFS Image Slicer
View tableView in ArticleTable 1. Fundamental Parameters of the IFS Image Slicer
Image slicer size 15 mm × 8 mm ×10 mm IFS working wavelength 350–1000 nm Slice number 32 Slice size 15 mm × 0.25 mm × 10 mm Slice mirror radius 340 mm Surface shape accuracy RMS < 40 nm Slice mirror roughness Rq < 1 nm
Table 2. Blade Crack Propagation Parameters
View tableView in ArticleTable 2. Blade Crack Propagation Parameters
tb E1 tw1 E2 tw2 W v 0.090 mm 72.9 kN/mm2 0.250 mm 72.9 kN/mm2 0.250 mm 37.000 mm 0.21
Table 3. Errors in the Allocation Table for the IFU Stacking Process
View tableView in ArticleTable 3. Errors in the Allocation Table for the IFU Stacking Process
Error term Error category Error margin Focus influence direction Focusing error amount ΔA1 Individual error 3′′ X 0.005 mm ΔA2 Individual error 3′′ X 0.005 mm ΔSb Individual error 0.001 mm X 0.017 mm ΔA4 Accumulated error 6′′ X 0–0.020 mm ΔA5 Accumulated error 6′′ X ΔDB Accumulated error 0.001 mm X 0–0.034 mm ΔDC Accumulated error 0.001 mm X ΔA6 Individual error 7′′ X 0.012 mm PV Surface shape error 79.1 nm — — RMS Surface shape error 15.82 nm — — Rq Surface shape error 0.7 nm — —
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Peng Chen, Kexin Li, Shuai Liu, Xin Zhang, Chi Song, Baichuan Ren, Zhengxiang Shen, Lei Hao, Zhanshan Wang, "Ultra-precision manufacturing technology for a 32-channel image slicer for IFS of CSST," Chin. Opt. Lett. 23, 082201 (2025)
Paper Information
Category: Optical Design and Fabrication
Received: Mar. 5, 2025
Accepted: Apr. 23, 2025
Published Online: Aug. 14, 2025
The Author Email: Zhengxiang Shen (shenzx@tongji.edu.cn), Lei Hao (haol@shao.ac.cn)
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