Surface Defect Detection in Transparent Objects Using Polarized Transmission Structured Light

Wei Wang; Jie Wang; Yiyang Huang; Huimin Yue; Yong Liu

doi:10.3788/AOS202141.1812002

Acta Optica Sinica, Volume. 41, Issue 18, 1812002(2021)

Surface Defect Detection in Transparent Objects Using Polarized Transmission Structured Light

Wei Wang, Jie Wang, Yiyang Huang, Huimin Yue^*, and Yong Liu

School of OptoElectronic Science and Engineering, University of Electronic Science and Technology of China, Chengdu, Sichuan 611731, China

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Wei Wang, Jie Wang, Yiyang Huang, Huimin Yue, Yong Liu. Surface Defect Detection in Transparent Objects Using Polarized Transmission Structured Light[J]. Acta Optica Sinica, 2021, 41(18): 1812002

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Paper Information

Category: Instrumentation, Measurement and Metrology

Received: Feb. 5, 2021

Accepted: Apr. 13, 2021

Published Online: Sep. 3, 2021

The Author Email: Yue Huimin (yuehuimin@uestc.edu.cn)

DOI:10.3788/AOS202141.1812002

Topics

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Instrumentation, Measurement and Metrology