Chinese Journal of Lasers, Volume. 26, Issue 2, 127(1999)

Study on ESPI Technique for Simultaneous Measurement of Whole in-Plane Displacement with the Polarization of Laser

[in Chinese], [in Chinese], and [in Chinese]
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    References(7)

    [1] [1] Jun-ichi Kato, Ichirou Yamaguchi, Qi Ping. Automatic deformation analysis by a TV speckle interferometer using a laser diode. Appl. Opt., 1993, 32(1):77~83

    [2] [2] Eiolf Vikhagen. Nondestructive testing by use of TV holography and deformation phase gradient calculation. Appl. Opt., 1990, 29(1):137~144

    [3] [3] A. J. Moore, J. R. Tyrer. Two-dimension strain measurement with ESPI. Opt. Lasers Eng., 1995, 23(5):381~402

    [4] [4] F. M. Santoyo, M. C. Shellabear, J. R. Tyrer. Whole field in-plane vibration analysis using pulsed phase-stepped ESPI. Appl. Opt., 1991, 30(7):717~721

    [5] [5] J. A. Leendertz. Interferometric displacement measurement on scattering surfaces utilizing speckle effect. J. Phys. E, 1970,3(3):214~218

    [6] [6] A. J. Moore, J. R. Tyrer. An electronic speckle pattern interferometer for complete in-plane displacement measurement. Meas. Sci. Technol., 1990, 1(10):1024~1030

    [7] [7] K. Creath. Phase-shifting speckle interferometry. Appl. Opt., 1985, 24(18):3053~3058

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    [in Chinese], [in Chinese], [in Chinese]. Study on ESPI Technique for Simultaneous Measurement of Whole in-Plane Displacement with the Polarization of Laser[J]. Chinese Journal of Lasers, 1999, 26(2): 127

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    Paper Information

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    Received: Aug. 18, 1997

    Accepted: --

    Published Online: Aug. 9, 2006

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