Chinese Optics, Volume. 17, Issue 4, 932(2024)

Design of large-aperture multi-band beam quality detection system

Cai LIU1, Xin YU1, Guo-tao PAN2, Guo-qiang HE1, Xiao-long NI1, and Su-ping BAI1、*
Author Affiliations
  • 1School of Opto-Electronic Engineering, Changchun University of Science and Technology, Changchun 130022, China
  • 2Changchun Institute of Optics, Fine Mechanics and Physics, Chinese Academy of Sciences, Changchun 130033, China
  • show less
    Figures & Tables(30)
    Schematic diagram of large-aperture multi-band beam quality detection system
    Schematic diagram of the optical structure of the wavefront detection system
    Point diagram of structure matrix of wavefront detection system
    Distortion curves of wavefront detection system
    Wave aberrations of wavefront detection system
    Optical structure of beam uniformity detection subsystem
    Optical path diagram of beam uniformity detection system
    Point diagram of structure matrix of beam uniformity detection system
    Distortion curves of beam uniformity detection system
    Wave aberrations of beam uniformity detection system
    Optical structure of beam quality detection subsystem
    Optical path of beam quality detection system
    Point diagram of structure matrix of beam quality detection system
    PSF of beam quality detection system
    Wave aberration of beam quality detection system
    Changes in beam quality caused by machining and setting
    Large-aperture multi-band beam quality detection system
    Spot images detected by the wavefront detection camera and their wavefront restoration results at λ1 band
    Spot images and the intensity distribution detected by the beam uniformity camera at λ1 band
    Spot images detected by the beam quality detection camera at λ1 band
    • Table 1. Technical index of mechanical structure of large-aperture multi-band beam quality detection system

      View table
      View in Article

      Table 1. Technical index of mechanical structure of large-aperture multi-band beam quality detection system

      指标数值
      系统整体尺寸360 mm×200 mm×300 mm(长×宽×高)
      系统重量≤25 kg
    • Table 2. Technical index of the wavefront detection system

      View table
      View in Article

      Table 2. Technical index of the wavefront detection system

      指标数值
      视场±3'
      波段(1064±3) nm、(1030±3) nm、(635±5) nm
      口径155 mm×140 mm
      缩束倍率1∶10.2
      畸变≤1%
      装调精度(RMS波前)≤λ/15
      工作环境20 °C±10 °C
      10 °C~30 °C光学系统设计结果波前PV值和RMS值的波动范围PV≤λ/10,RMS≤λ/20
      公差指标(RMS波前)≤λ/8
    • Table 3. Lens parameters of wavefront detection system

      View table
      View in Article

      Table 3. Lens parameters of wavefront detection system

      表面类型曲率半径/mm厚度/mm材料
      标准面−576.126−260.000MIRROR
      标准面−69.040150.000MIRROR
      标准面Infinity141.761
      标准面−192.0974.000H-ZPK5
      标准面−35.3502.998
      标准面−33.4603.000H-F4
      标准面−236.4553.000
      标准面−376.7003.000H-LAF3B
      标准面−116.68030.000
    • Table 4. Tolerance of wavefront detection system

      View table
      View in Article

      Table 4. Tolerance of wavefront detection system

      No.光圈数厚度/mm透镜偏心/mm透镜倾斜/(´)折射率阿贝误差%
      镜130.050.010.60.0010.3
      镜230.050.010.60.0010.3
      镜330.050.031.50.0010.3
      镜430.050.031.50.0010.3
      镜530.050.031.50.0010.3
    • Table 5. Monte Carlo analysis results for λ1、λ2、λ3 in wavefront detection system

      View table
      View in Article

      Table 5. Monte Carlo analysis results for λ1、λ2、λ3 in wavefront detection system

      指标数值
      λ1λ2λ3
      蒙特卡洛分析/%909090
      RMS波前0.0931λ10.0922λ20.1303λ3
    • Table 6. Technical index of beam uniformity detection system

      View table
      View in Article

      Table 6. Technical index of beam uniformity detection system

      指标数值
      缩束倍率1:4.5
      畸变≤1%
      均匀性检测指标≥0.8
      10 °C~30 °C光学系统设计结果波前PV值和RMS值的波动范围PV≤λ/10,RMS≤λ/20
      公差指标(RMS波前)≤λ/8
    • Table 7. Lens parameters of beam uniformity detection subsystem

      View table
      View in Article

      Table 7. Lens parameters of beam uniformity detection subsystem

      表面类型曲率半径/mm厚度/mm材料
      标准面98.1364.000H-LAF3B
      标准面−61.2322.000
      标准面−54.8832.000H-F4
      标准面32.9645.984
      标准面38.5034.000H-ZPK5
      标准面−172.54592.637
      标准面Infinity27.515
      标准面557.9631.000H-F4
      标准面9.3750.800
      标准面11.4362.000H-ZPK5
      标准面−12.68710.000
    • Table 8. Monte Carlo analysis results for λ1、λ2、λ3 in beam uniformity detection system

      View table
      View in Article

      Table 8. Monte Carlo analysis results for λ1、λ2、λ3 in beam uniformity detection system

      指标数值
      λ1λ2λ3
      蒙特卡洛分析/%909090
      RMS波前0.1101λ10.1172λ20.1439λ3
    • Table 9. Technical index of beam quality detection system

      View table
      View in Article

      Table 9. Technical index of beam quality detection system

      指标数值
      光束质量β因子β≤1.3
      10 °C~30 °C光学系统设计结果波前PV值和RMS值的波动范围PV≤λ/10,RMS≤λ/20
    • Table 10. Lens parameters of beam quality detection subsystem

      View table
      View in Article

      Table 10. Lens parameters of beam quality detection subsystem

      表面类型曲率半径/mm厚度/mm材料
      标准面88.1584.000H-LAF3B
      标准面−54.6252.090
      标准面−44.5842.000H-F4
      标准面37.7382.121
      标准面35.8774.000H-ZPK5
      标准面−779.68293.327
    Tools

    Get Citation

    Copy Citation Text

    Cai LIU, Xin YU, Guo-tao PAN, Guo-qiang HE, Xiao-long NI, Su-ping BAI. Design of large-aperture multi-band beam quality detection system[J]. Chinese Optics, 2024, 17(4): 932

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Received: Dec. 20, 2023

    Accepted: --

    Published Online: Aug. 9, 2024

    The Author Email:

    DOI:10.37188/CO.2023-0228

    Topics