Chinese Optics Letters, Volume. 9, Issue 12, 120001(2011)
High-precision method for measuring the photothermal properties of transparent media with digital holography (Invited Paper)
[1] [1] A. Marcano O., C. Loper, and N. Melikechi, Appl. Phys. Lett. 78, 3415 (2001).
[2] [2] H. Cabrera, A. Marcano, and Y. Castellanos, Condens. Matter Phs. 9, 385 (2006).
[3] [3] D. C. Clark and M. K. Kim, Appl. Opt. 50, 1668 (2011).
[4] [4] J. Shen, R. D. Lowe, and R. D. Snook, Chem. Phys. 165, 385 (1992).
[5] [5] E. Cuche, F. Bevilacqua, and C. Depeursinge, Opt. Lett. 24, 291 (1999).
[6] [6] C. Mann, L. Yu, C.-M. Lo, and M. Kim, Opt. Express 13, 8693 (2005).
[7] [7] S. D. Woodruff and E. S. Yeung, Anal. Chem. 54, 1174 (1982).
[8] [8] L. Yu and M. K. Kim, Opt. Lett. 30, 2092 (2005).
[9] [9] D. C. Clark and M. K. Kim, Proc. SPIE 7908, 79080T (2011).
[10] [10] W. S. Pegau, D. Gray, and J. R. V. Zaneveld, Appl. Opt. 36, 6035 (1997).
[11] [11] M. Babin, D. Stramski, G. M. Ferrari, H. Claustre, A. Bricaud, G. Obolensky, and N. Hoepffner, J. Geophys. Res. 108, 3211 (2003).
[12] [12] S. M. Colcombe, R. D. Lowe, and R. D. Snook, Anal. Chim. Acta. 356, 277 (1997).
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David C., Myung K., "High-precision method for measuring the photothermal properties of transparent media with digital holography (Invited Paper)," Chin. Opt. Lett. 9, 120001 (2011)
Category: Measurement
Received: Aug. 26, 2011
Accepted: Sep. 15, 2011
Published Online: Nov. 18, 2011
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