Acta Physica Sinica, Volume. 69, Issue 9, 096801-1(2020)

High resolution imaging based on photo-emission electron microscopy excited by deep ultraviolet laser

Hao-Chang Lü1,2, Yun-Chi Zhao2, Guang Yang1, Bo-Wen Dong1, Jie Qi1, Jing-Yan Zhang1, Zhao-Zhao Zhu2, Yang Sun2, Guang-Hua Yu1, Yong Jiang1, Hong-Xiang Wei2, Jing Wang2, Jun Lu2, Zhi-Hong Wang2, Jian-Wang Cai2, Bao-Gen Shen1,2, Feng Yang3, Shen-Jin Zhang3, and Shou-Guo Wang1,2、*
Author Affiliations
  • 1Department of Materials Physics and Chemistry, School of Materials Science and Engineering, University of Science and Technology Beijing, Beijing 100083, China
  • 2State Key Laboratory of Magnetism, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
  • 3Key Laboratory of Functional Crystals and Laser Technology, Technical Institute of Physics and Chemistry, Chinese Academy of Sciences, Beijing 100190, China
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    References(82)

    [71] Zhao Y C[J]. Ph. D. Dissertation(2019).

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    Hao-Chang Lü, Yun-Chi Zhao, Guang Yang, Bo-Wen Dong, Jie Qi, Jing-Yan Zhang, Zhao-Zhao Zhu, Yang Sun, Guang-Hua Yu, Yong Jiang, Hong-Xiang Wei, Jing Wang, Jun Lu, Zhi-Hong Wang, Jian-Wang Cai, Bao-Gen Shen, Feng Yang, Shen-Jin Zhang, Shou-Guo Wang. High resolution imaging based on photo-emission electron microscopy excited by deep ultraviolet laser[J]. Acta Physica Sinica, 2020, 69(9): 096801-1

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    Paper Information

    Received: Jan. 13, 2020

    Accepted: --

    Published Online: Nov. 26, 2020

    The Author Email:

    DOI:10.7498/aps.69.20200083

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