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Chinese Optics Letters, Volume. 13, Issue 8, 081901(2015)

Extended transient-grating self-referenced spectral interferometry for sub-100  nJ femtosecond pulse characterization

Xiong Shen1, Jun Liu1,2、*, Fangjia Li1,3, Peng Wang1, and Ruxin Li1,2
Author Affiliations
  • 1State Key Laboratory of High Field Laser Physics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 2IFSA Collaborative Innovation Center, Shanghai Jiao Tong University, Shanghai 200240, China
  • 3Tongji University, Shanghai 200092, China
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    [9] R. Trebino. Frequency-Resolved Optical Gating: The Measurement of Ultrashort Laser Pulses(2000).

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    [2] Guodong Liu, Binghui Lu, Heyi Sun, Bingguo Liu, Fengdong Chen, Zhitao Zhuang, "Improved phase-shifting diffraction interferometer for microsphere topography measurements," Chin. Opt. Lett. 14, 071202 (2016)

    Cited By

    [3] Xiong Shen, Peng Wang, Jun Liu, Ruxin Li. Compact transient-grating self-referenced spectral interferometry for sub-nanojoule femtosecond pulse characterization. Applied Optics, 56, 582(2017).

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    Xiong Shen, Jun Liu, Fangjia Li, Peng Wang, Ruxin Li, "Extended transient-grating self-referenced spectral interferometry for sub-100  nJ femtosecond pulse characterization," Chin. Opt. Lett. 13, 081901 (2015)

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    Paper Information

    Category: Materials

    Received: Mar. 25, 2015

    Accepted: May. 27, 2015

    Published Online: Sep. 14, 2018

    The Author Email: Jun Liu (jliu@siom.ac.cn)

    DOI:10.3788/COL201513.081901

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology