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OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 22, Issue 6, 51(2024)

Particle Identification Based on Polarization Scattering and Imaging Analysis

ZHANG Jin-ying1 and LI Jing-wen1
Author Affiliations
  • 1[in Chinese]
  • 1School of Science，Jiangnan University，Wuxi 214122，China
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    ZHANG Jin-ying, LI Jing-wen. Particle Identification Based on Polarization Scattering and Imaging Analysis[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2024, 22(6): 51

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    Received: Jul. 10, 2024

    Accepted: Jan. 21, 2025

    Published Online: Jan. 21, 2025

    The Author Email:

    DOI:

    CSTR:32186.14.

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology