OPTICS & OPTOELECTRONIC TECHNOLOGY, Volume. 22, Issue 6, 51(2024)
Particle Identification Based on Polarization Scattering and Imaging Analysis
Accurate monitoring of particle size,shape,distribution,and composition is crucial across many industrial and scientific domains. However,existing particle analysis methods are affected by the refractive index and morphology of particles,and have limited measurement accuracy,and are difficult to handle irregular particles or high-throughput application. To overcome these limitations,an innovative approach for real-time,high-throughput classification of micron-sized particles is presented in this paper. Particles of various types are introduced into a custom-designed microfluidic channel,and images are captured by a polarization camera equipped with an on-chip array of four polarization filters. These filters allow the simultaneous registration of scattered intensities polarized at 0°,45°,90°,and 135°. From these,Stokes parameters,as well as the degree and angle of polarization,are calculated,facilitating the initial differentiation of particles. By fusing the most relevant polarization components,classification accuracy is further enhanced.
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ZHANG Jin-ying, LI Jing-wen. Particle Identification Based on Polarization Scattering and Imaging Analysis[J]. OPTICS & OPTOELECTRONIC TECHNOLOGY, 2024, 22(6): 51
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Received: Jul. 10, 2024
Accepted: Jan. 21, 2025
Published Online: Jan. 21, 2025
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CSTR:32186.14.