Journals Articles Conferences News About CLP
Submit a paper Email Alert
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
2D MaterialsTransformation opticsQuantum PhotonicsSmall lasersSemiconductor UV PhotonicsSupersymmetric microring laser arrays

Electro-Optic Technology Application, Volume. 40, Issue 3, 34(2025)

Design Analysis of Common Aperture Spot Detection Device

MA Wenchao1, YANG Haibo1, AN Chaowei1, LI Yuqing1, LI Yuhai1, and HUANG Kai2
Author Affiliations
  • 1National Key Laboratory of Electromagnetic Space Security, Tianjin, China
  • 2Guoqi Optoelectronic Technology (Tianjin) Co., Ltd., Tianjin, China
    • show less
    AbstractGet PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (3)
    Tools
    Paper Information
    Topics
    References(3)

    [4] [4] D'AMBROSIO D, ANTONIOLI E, ALBERIZZI L, et al. Performance evaluation of an adaptive threshold segmentation software for PET lesion delineation[J]. Physica Medica, 2016(32): 102.

    [6] [6] STONE T, MANGAN M, WYSTRACH A. Rotation invariant visual processing for spatial memory in insects[J]. Interface Focus, 2018, 8(4): 45-56.

    [8] [8] SINGH C, BALA A. A local Zernike moment-based unbiased nonlocal means fuzzy C-Means algorithm for segmentation of brain magnetic resonance images[J]. Expert Systems with Applications, 2019, 118: 163-164.

    Tools

    Get Citation

    Copy Citation Text

    MA Wenchao, YANG Haibo, AN Chaowei, LI Yuqing, LI Yuhai, HUANG Kai. Design Analysis of Common Aperture Spot Detection Device[J]. Electro-Optic Technology Application, 2025, 40(3): 34

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Set citation alerts for article
    Save article for my favorites
    Paper Information

    Category:

    Received: Jun. 10, 2025

    Accepted: Sep. 5, 2025

    Published Online: Sep. 5, 2025

    The Author Email:

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology