Infrared Technology, Volume. 46, Issue 8, 879(2024)
Reliability Verification Test of Mid-Wave Infrared 640×512(25μm) Detector Assembly
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SONG Hongwei, LIU Su, LI Haiying, YU Hongyou, SHI Shengbing, GUO Xiuli, LI Haolan, ZHANG Yaping, WANG Xiangqian. Reliability Verification Test of Mid-Wave Infrared 640×512(25μm) Detector Assembly[J]. Infrared Technology, 2024, 46(8): 879
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