Opto-Electronic Engineering, Volume. 44, Issue 7, 725(2017)

I-V characteristic test and curve fitting of high-altitude solar cell

Yuyan Zhang1、*, Yong Liu1, Yintang Wen2, and Xiaoyuan Luo1
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    Yuyan Zhang, Yong Liu, Yintang Wen, Xiaoyuan Luo. I-V characteristic test and curve fitting of high-altitude solar cell[J]. Opto-Electronic Engineering, 2017, 44(7): 725

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    Paper Information

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    Received: May. 17, 2017

    Accepted: --

    Published Online: Nov. 27, 2017

    The Author Email: Zhang Yuyan (yyzhang@ysu.edu.cn)

    DOI:10.3969/j.issn.1003-501x.2017.07.009

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