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Laser & Optoelectronics Progress, Volume. 56, Issue 14, 141501(2019)

Surface Defect Detectionon Polished Surface Based on Reflection Moiré

Xianming Xiong1,2、*, Hongqiang Shi1, and Xingyu Zeng1
Author Affiliations
  • 1 School of Electrical Engineering and Automation, Guilin University of Electronic Technology, Guilin, Guangxi 541004, China
  • 2 Key Laboratory of Optoelectronics Information Processing for Guangxi Universities, Guilin, Guangxi 541004, China
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    Article index updated: Sep. 10, 2025

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    Xianming Xiong, Hongqiang Shi, Xingyu Zeng. Surface Defect Detectionon Polished Surface Based on Reflection Moiré[J]. Laser & Optoelectronics Progress, 2019, 56(14): 141501

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    Paper Information

    Category: Machine Vision

    Received: Dec. 18, 2018

    Accepted: Feb. 17, 2019

    Published Online: Jul. 12, 2019

    The Author Email: Xianming Xiong (5311128@qq.com)

    DOI:10.3788/LOP56.141501

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology