Edge enhancement by using two-wave mixing and its application to pattern recognition

Huayong Ge; Qiushi Ren; Baohua Wang; Wanrong Li; Haiying Cheng

Chinese Optics Letters, Volume. 1, Issue 12, 12705(2003)

Huayong Ge^1、*, Qiushi Ren², Baohua Wang¹, Wanrong Li², and Haiying Cheng²

Author Affiliations

¹School of Communication and Information Engineering, Shanghai University, Shanghai 200072

²Institute for Laser Medicine and Bio Photonics, Shanghai Jiaotong University, Shanghai 200030

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References(6)

[1] [1] Z. Q. Wang, B. L. Liang, H. L. Liu, J. H. Guan, and G. G. Mu, Proc. SPIE 4110, 277 (2000).

[2] [2] X. D. Mu, X. G. Xu, J. Chen, Z. S. Shao, and M. H. Jiang, Opt. Commun. 141, 189 (1997).

[3] [3] J. A. Khoury, G. Hussain, and R. W. Eason, Opt. Commun. 70, 272 (1989).

[4] [4] J. E. heebner and R. W. Boyd, Opt. Commun. 182, 243 (2000).

[5] [5] J. L. Zhao, Q. T. Xu, W. M. Zhou, D. S. Yang, S. Kapphan, and R. Pankrath, Opt. Commun. 212, 287 (2002).

[6] [6] M. S. Alam, O. Perez, and M. A. Karim, Appl. Opt. 32, 3102 (1993).

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Huayong Ge, Qiushi Ren, Baohua Wang, Wanrong Li, Haiying Cheng, "Edge enhancement by using two-wave mixing and its application to pattern recognition," Chin. Opt. Lett. 1, 12705 (2003)

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Paper Information

Category:

Received: Jul. 14, 2003

Accepted: --

Published Online: Jun. 6, 2006

The Author Email: Huayong Ge (huayongge@yahoo.com.cn)

DOI:

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology