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Laser & Optoelectronics Progress, Volume. 55, Issue 7, 71012(2018)

Single Sample Face Recognition Based on Improved Center-Symmetric Local Binary Pattern and Bit-Plane Decomposition

Yang Huixian1,2, Zhang Fei1、*, Chen Yong1, Liu Jian1, and Zhou Tongtong2
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    Yang Huixian, Zhang Fei, Chen Yong, Liu Jian, Zhou Tongtong. Single Sample Face Recognition Based on Improved Center-Symmetric Local Binary Pattern and Bit-Plane Decomposition[J]. Laser & Optoelectronics Progress, 2018, 55(7): 71012

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    Paper Information

    Category: Image Processing

    Received: Jan. 2, 2018

    Accepted: --

    Published Online: Jul. 20, 2018

    The Author Email: Zhang Fei (771935992@qq.com)

    DOI:10.3788/lop55.071012

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology