The transverse frequency-resolved optical gating (T-FROG) method based on a thin-film lithium niobate waveguide platform was previously proved to enable the accurate, in situ, and full-parameter characterization of waveguided femtosecond pulses inside integrated circuits. Herein, we confirm that the T-FROG method can operate over broadband spectra (e.g., 150 nm), which are benefited by the broadband operation characteristic features of transverse second-harmonic generation. Experimental results indicate that this method exhibits high sensitivity and signal-to-noise ratio for measuring pulses of various wavelengths. Furthermore, the proposed approach is applied to measure unknown pulses generated from a photonic crystal fiber, and the result indicates its potential for characterizing complex pulses.