Laser & Optoelectronics Progress, Volume. 62, Issue 16, 1637003(2025)

Defect Detection Algorithm of Infrared Insulator Image Based on Guided Attention and Scale Perception

Yufei Rao1、*, Wei Guo2, Xiaoyan Song1, Gang Liang1, Fengqing Cui1, and Binjun Ou3
Author Affiliations
  • 1Electric Power Science Research Institute, State Grid Henan Electric Power Company, Zhengzhou 450003, Henan , China
  • 2State Grid Henan Electric Power Company, Zhengzhou 450000, Henan , China
  • 3State Key Laboratory of New Energy Power System, North China Electric Power University, Beijing 102206, China
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    References(35)

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    Yufei Rao, Wei Guo, Xiaoyan Song, Gang Liang, Fengqing Cui, Binjun Ou. Defect Detection Algorithm of Infrared Insulator Image Based on Guided Attention and Scale Perception[J]. Laser & Optoelectronics Progress, 2025, 62(16): 1637003

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    Paper Information

    Category: Digital Image Processing

    Received: Dec. 31, 2024

    Accepted: Mar. 14, 2025

    Published Online: Aug. 11, 2025

    The Author Email: Yufei Rao (raoyufei1984666@yeah.net)

    DOI:10.3788/LOP242530

    CSTR:32186.14.LOP242530

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