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Chinese Journal of Lasers, Volume. 32, Issue 3, 384(2005)

Laser-Induced Damage of Ta2O5/SiO2 Two-Cavity Narrow-Band Interference Filters

[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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    [2] [2] H. A. Macleod. Thin-Film Optical Filters [M]. Third Edition. Bristol and Philadelphia: Institute of Physics Publishing,2001

    [5] [5] Z. L. Wu, P. K. Kuo, Y. S. Lu et al.. Laser-induced surface thermal lensing for thin film characterizations [C]. SPIE, 1995, 2714:294～304

    [6] [6] Z. L. Wu, P. K. Kuo, R. L. Thomas et al.. Absorption measurement of thin films by using photothermal techniques; the influence of thermal properties [C]. SPIE, 1995, 2428:113～122

    [8] [8] Optics and Optical instruments―Lasers and laser related equipment―Test methods for laser induced damage threshold of optical surfaces―Part 1: 1 on 1 test [S]. ISO/DIS 11254-1.2, 1995

    [9] [9] Laser Induced Damage Threshold and Certification Procedures for Optical Materials [S]. NASA Reference Publication 1395, 1997

    CLP Journals

    [1] Huang Caihua, Xue Yiyu, Peng Hua, Xia Zhilin, Guo Peitao. Effect of Annealing on the Optical Properties of Ta2O5 Films Prepared by Electron Beam Evaporation[J]. Chinese Journal of Lasers, 2009, 36(s1): 364

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Laser-Induced Damage of Ta2O5/SiO2 Two-Cavity Narrow-Band Interference Filters[J]. Chinese Journal of Lasers, 2005, 32(3): 384

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    Paper Information

    Category: materials and thin films

    Received: Dec. 2, 2003

    Accepted: --

    Published Online: Jun. 1, 2006

    The Author Email: (wdgao@mail.siom.ac.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology