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Chinese Journal of Lasers, Volume. 31, Issue 9, 1050(2004)

Wavelet Transform for Evaluation of Semiconductor Laser Reliability

[in Chinese]1、*, [in Chinese]1, [in Chinese]2, [in Chinese]1, and [in Chinese]1
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  • 2[in Chinese]
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    [1] [1] M. M. Choy, C. E. Barnes. Effective screen for fast aging InGaAsP BH lasers using electrical derivatives [J]. Electron. Lett., 1985, 21(19):846～848

    [2] [2] Shi Jiawei, Jin Enshun, Gao Dingsan. The junction voltage saturation and reliability of semiconductor laser [J]. Optical and Quantum Electronics, 1992, 24(7):775～781

    [4] [4] Shi Jiawei, Jin Enshun, Li Hongyan et al.. The characteristic junction parameter of a semiconductor laser and its relation with reliability [J]. Optical and Quantum Electronics, 1996, 28(6):647～651

    [5] [5] Li Hongyan, Shi Jiawei, Jin Enshun et al.. Effective method for evaluation of semiconductor laser quality [J]. Microelectronics Reliability, 2000, 40:333～337

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    [2] Xia Hua, Dong Fengzhong, Tu Guojie, Wu Bian, Zhang Zhirong, Wang Yu. High Sensitive Detection of Carbon Monoxide Based on Novel MultiPass Cell[J]. Acta Optica Sinica, 2010, 30(9): 2596

    [3] Zhang Shuang, Guo Shuxu, Gao Fengli, Guo Xin, Cao Junsheng, Yu Siyao. Direct Current and 1/f Noise Characteristics of InGaAsP/GaAs High Power Quantum Well Laser Diodes[J]. Chinese Journal of Lasers, 2008, 35(8): 1144

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Wavelet Transform for Evaluation of Semiconductor Laser Reliability[J]. Chinese Journal of Lasers, 2004, 31(9): 1050

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    Paper Information

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    Received: May. 12, 2003

    Accepted: --

    Published Online: Jun. 12, 2006

    The Author Email: (guosx@mail.jlu.edu.cn)

    DOI:

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology