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Acta Optica Sinica, Volume. 38, Issue 5, 0512004(2018)

Concentration Measurements of NO2 and NH3 Based on Wavelength-Modulation Frequency-Division-Multiplexing Spectroscopic Technique

Xiang Chen1,2, Ruifeng Kan1、*, Chenguang Yang1, Mai Hu1, Lu Yao1, Xueli Fan1, Yabai He1, Xiaofan Pei1, and Jianguo Liu1
Author Affiliations
  • 1 Key Lab of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Hefei, Anhui 230031, China
  • 2 University of Science and Technology of China, Hefei, Anhui 230022, China
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    AbstractGet PDF(in Chinese)
    Figures&Tables (9)
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    Figures & Tables(9)
    Simulated absorption spectra of gases

    Fig. 1. Simulated absorption spectra of gases

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    Simulated second harmonic signals of absorption spectra

    Fig. 2. Simulated second harmonic signals of absorption spectra

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    Schematic of experimental apparatus

    Fig. 3. Schematic of experimental apparatus

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    Normalized second harmonic peak value under different modulation voltages. (a) NO2; (b) NH3

    Fig. 4. Normalized second harmonic peak value under different modulation voltages. (a) NO2; (b) NH3

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    Second harmonic signals measured under different conditions. (a) NO3; (b) NH3

    Fig. 5. Second harmonic signals measured under different conditions. (a) NO3; (b) NH3

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    Calibration curves. (a) NO2; (b) NH3

    Fig. 6. Calibration curves. (a) NO2; (b) NH3

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    Detection limits. (a) NO2; (b) NH3

    Fig. 7. Detection limits. (a) NO2; (b) NH3

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    Concentration measument curves during one day. (a) NO2; (b) NH3

    Fig. 8. Concentration measument curves during one day. (a) NO2; (b) NH3

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    Average concentration measured by WMS. (a) NO2; (b) NH3

    Fig. 9. Average concentration measured by WMS. (a) NO2; (b) NH3

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    Xiang Chen, Ruifeng Kan, Chenguang Yang, Mai Hu, Lu Yao, Xueli Fan, Yabai He, Xiaofan Pei, Jianguo Liu. Concentration Measurements of NO2 and NH3 Based on Wavelength-Modulation Frequency-Division-Multiplexing Spectroscopic Technique[J]. Acta Optica Sinica, 2018, 38(5): 0512004

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    Paper Information

    Category: Instrumentation, measurement, and metrology

    Received: Nov. 14, 2017

    Accepted: --

    Published Online: Jul. 10, 2018

    The Author Email: Kan Ruifeng (kanruifeng@aiofm.ac.cn)

    DOI:10.3788/AOS201838.0512004

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology