Opto-Electronic Engineering, Volume. 46, Issue 11, 180458(2019)

An accurate measurement method for the spatial resolution of area array spectral imaging equipment

Chu Songnan*, Liu Haitao, Hu Qiqi, Wang Haifeng, Zhang Dayong, and Luo Yongquan
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    References(5)

    [1] [1] Zhang S R. Basic parameter selection in the development of electro-optical imaging remote sensor[J]. Chinese Space Science and Technology, 1981(2): 18–21, 17.

    [3] [3] Holst G C. Imaging system performance based upon Fλ/d[J]. Optical Engineering, 2007, 46(10): 103204.

    [5] [5] Polder G, van der Heijden G W A M. Calibration and characte-rization of spectral imaging systems[J]. Proceedings of SPIE, 2001, 4548: 10–17.

    [6] [6] Wang W L, Li C Y, Tollner E W, et al. A liquid crystal tunable filter based shortwave infrared spectral imaging system: calibration and characterization[J]. Computers and Electronics in Agricul-ture, 2012, 80: 135–144.

    [8] [8] Guzhov V I, Il’inykh S P, Marchenko I O. Method of increasing the spatial resolution in digital holographic microscopy[J]. Op-toelectronics, Instrumentation and Data Processing, 2018, 54(3): 301–306.

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    Chu Songnan, Liu Haitao, Hu Qiqi, Wang Haifeng, Zhang Dayong, Luo Yongquan. An accurate measurement method for the spatial resolution of area array spectral imaging equipment[J]. Opto-Electronic Engineering, 2019, 46(11): 180458

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    Paper Information

    Category: Article

    Received: Sep. 5, 2018

    Accepted: --

    Published Online: Dec. 8, 2019

    The Author Email: Songnan Chu (snchu@mail.ustc.edu.cn)

    DOI:10.12086/oee.2019.180458

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