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The Journal of Light Scattering, Volume. 36, Issue 4, 479(2024)

The characteristics of sister lines pen marks were studied based on Reflectance Transformation Imaging

SUN Linjie1, CHEN Weina1、*, ZHENG Yu2, and LIU Ning3
Author Affiliations
  • 1School of Investigation, People's Public Security University of China, Beijing 100038, China
  • 2Criminal police detachment, Weifang City Public Security Bureau, Weifang, Shandong 261041, China
  • 3Jiangsu Police College, Nanjing, Jiangsu 210031, China
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    SUN Linjie, CHEN Weina, ZHENG Yu, LIU Ning. The characteristics of sister lines pen marks were studied based on Reflectance Transformation Imaging[J]. The Journal of Light Scattering, 2024, 36(4): 479

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    Paper Information

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    Received: Aug. 12, 2024

    Accepted: Jan. 21, 2025

    Published Online: Jan. 21, 2025

    The Author Email: Weina CHEN (645421515@qq.com)

    DOI:10.13883/j.issn1004-5929.202404014

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology