Denoising of Second Harmonic Signals of the Absorption Spectrum Using the Frequency Decomposition Combined With the Savitzky-Golay Filtering

TU Xing-hua; LUAN Xiao-chen; WANG Zhan

doi:10.3964/j.issn.1000-0593(2025)05-1209-08

Spectroscopy and Spectral Analysis, Volume. 45, Issue 5, 1209(2025)

Denoising of Second Harmonic Signals of the Absorption Spectrum Using the Frequency Decomposition Combined With the Savitzky-Golay Filtering

TU Xing-hua, LUAN Xiao-chen, and WANG Zhan

Author Affiliations

College of Electronic and Optical Engineering & College of Flexible Electronics (Future Technology), Nanjing University of Posts and Telecommunications, Nanjing 210023, China

show less

Abstract Get PDF(in Chinese)

References(7)

[2] [2] Dragomiretskiy K, Zosso D. IEEE Transactions on Signal Processing, 2014, 62(3): 531.

[3] [3] Shabani Z, Ghavami Sabouri S, Khorsandi A. Optical and Quantum Electronics, 2016, 48(12): 526.

[9] [9] Zhao P, Ding D, Li K T, et al. Optics Communications, 2024, 567: 130327.

[10] [10] Qiu H F, Lan J Q, Hu H, et al. Infrared Physics and Technology, 2024, 141: 105466.

[11] [11] Wang Y S, Chen S X, Kong Q M, et al. Optics and Lasers in Engineering, 2024, 181: 108420.

[12] [12] Lorbeer R A, Bittner M, Kliebisch O, et al. IEEE Open Journal of Instrumentation and Measurement, 2024, 3: 70002.

[13] [13] Tosi D. Sensors, 2017, 17(10): 2368.

Tools

Get Citation

Copy Citation Text

TU Xing-hua, LUAN Xiao-chen, WANG Zhan. Denoising of Second Harmonic Signals of the Absorption Spectrum Using the Frequency Decomposition Combined With the Savitzky-Golay Filtering[J]. Spectroscopy and Spectral Analysis, 2025, 45(5): 1209

Download Citation

EndNote(RIS)BibTex Plain Text

Set citation alerts for article

Save article for my favorites

Paper Information

Received: Jul. 11, 2024

Accepted: May. 21, 2025

Published Online: May. 21, 2025

The Author Email:

DOI:10.3964/j.issn.1000-0593(2025)05-1209-08

Topics

laser devices and laser physics

Lasers and Laser Optics

Laser physics

laser manufacturing

Instrumentation, Measurement and Metrology