Laser & Optoelectronics Progress, Volume. 58, Issue 22, 2212003(2021)

Calibration Method for Line Structured Light Measurement System Based on Vanishing Point

Zhaoxu Wang1,2, Yanjun Fu1,2、*, Ye Li1,2, Kejun Zhong1,2, and Wei Bao1,2
Author Affiliations
  • 1Key Laboratory of Nondestructive Testing Technology, Ministry of Education, Nanchang Hangkong University, Nanchang, Jiangxi 330063, China
  • 2School of Measuring and Optical Engineering, Nanchang Hangkong University, Nanchang, Jiangxi 330063, China
  • show less
    Figures & Tables(17)
    Model of line structured light measurement
    Model of one-dimensional direction calibration
    Position determination of world coordinate system
    Structure of experimental setup
    Influence of SNR on slope of feature strip
    Influence of SNR on calibration error
    Calibrated images processing. (a)--(c) Original images; (d)--(f) processed images
    Measurement of standard step block. (a) Object picture; (b) measured point clouds; (c) wrapped result
    Measured height corresponding to 23rd stripe
    Comparison of RMSE
    Measurement of sphere cover. (a) Object picture; (b) measured point clouds; (c) wrapped result
    Diagram of deviation distribution
    Comparison of absolute error
    Measurement of complex models. (a)--(d) Object models; (e)--(h) measured point clouds; (i)--(l) wrapped results
    • Table 1. Calibration results in three dimensions

      View table

      Table 1. Calibration results in three dimensions

      DirectionIef
      X-direction1.7562-0.0489-0.0354
      Y-direction0.21790.03370.0270
      Z-direction1.7925-0.0752-0.0604
    • Table 2. RMSE analysis unit: mm

      View table

      Table 2. RMSE analysis unit: mm

      ParameterStep1Step2Step3Step4Step5
      Standard thickness5.001210.003615.002820.003425.0021
      Maximum error0.07130.06820.06570.07820.0853
      Minimum error0.00360.00450.00620.00680.0073
      RMSE0.03250.03040.03590.03360.0298
    • Table 3. MAE analysis unit: mm

      View table

      Table 3. MAE analysis unit: mm

      ParameterPosition1Position2Position3Position4Position5
      Actual diameter5.0022
      Fitted diameter5.02965.03375.03305.03165.0365
      Absolute error0.02740.03150.03080.02940.0343
      MAE0.0306
    Tools

    Get Citation

    Copy Citation Text

    Zhaoxu Wang, Yanjun Fu, Ye Li, Kejun Zhong, Wei Bao. Calibration Method for Line Structured Light Measurement System Based on Vanishing Point[J]. Laser & Optoelectronics Progress, 2021, 58(22): 2212003

    Download Citation

    EndNote(RIS)BibTexPlain Text
    Save article for my favorites
    Paper Information

    Category: Instrumentation, Measurement and Metrology

    Received: Dec. 28, 2020

    Accepted: Jan. 27, 2021

    Published Online: Nov. 5, 2021

    The Author Email: Yanjun Fu (fyjpkh@sina.com.cn)

    DOI:10.3788/LOP202158.2212003

    Topics