High Power Laser and Particle Beams, Volume. 34, Issue 6, 064010(2022)
Dual degrees of freedom diagnosis with high energy electron lens radiography
Fig. 1. Schematic diagram of HEELR to make angle selection with an aperture. (a) The schematic of point-to-point imaging beamline with an aperture at the Fourier plane. (b) The angle distribution of incident electrons. (c1) and (c2) illustrate the electron angle distributions after target with different thicknesses and the corresponding position distributions at the Fourier plane. (d1) and (d2) are the electron angle distributions after penetrating the system with E/B field and the corresponding position distributions at the Fourier plane. The purple rectangular shadow indicates the aperture acceptance area
Fig. 2. The principle of areal density difference method to diagnose the areal density and E/B field. (a) The scattering angle distributions after the grille scattering target. Different color corresponds to different thicknesses (
Fig. 3. Overall design of the dual degrees of freedom diagnostic. (a) The incident beams will be scattered by the scattering target before penetrating the real diagnosed target. (b) The front view (perpendicular to the beam bunches) of the scattering target, different color indicates different thickness
Fig. 4. (a) The wedge shape represents the hydrogen sample with gradient areal density. The color indicates the value of deflection angle from the E/B field and the coordinate system is as shown. (b) The ellipse shape aperture sets the upper limit of the angle acceptance as 1mrad. (c) The ring shape aperture which sets the angle acceptance as (1,2) mrad
Fig. 5. The analysis results when the angle acceptance of the ellipse shape aperture is 1 mrad
Fig. 6. The analysis results when the angle acceptance is set as from 1mrad to 2 mrad by a ring shape aperture
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Jiahao Xiao, Yingchao Du, Haoqing Li, Yongtao Zhao, Liang Sheng. Dual degrees of freedom diagnosis with high energy electron lens radiography[J]. High Power Laser and Particle Beams, 2022, 34(6): 064010
Category: Particle Beams and Accelerator Technology
Received: Dec. 7, 2021
Accepted: --
Published Online: Jun. 2, 2022
The Author Email: Yingchao Du (dych@mail.tsinghua.edu.cn)