Chinese Journal of Quantum Electronics, Volume. 42, Issue 2, 187(2025)

Investigation of high‑precision real time wavelength monitoring method based on Fabry‑Perot etalon

LIN Yuqing1,2, XIA Hua1、*, ZHANG Zhirong1,2,3,4,5、**, SUN Pengshuai1, WU Bian1, LI Zhe6, and CAI Yongjun7
Author Affiliations
  • 1Anhui Provincial Key Laboratory of Photonic Devices and Materials, Anhui Institute of Optics and Fine Mechanics, HFIPS, Chinese Academy of Sciences, Hefei 230031, China
  • 2Science Island Branch, Graduate School of University of Science and Technology of China, Hefei 230026, China
  • 3Key Laboratory of Environmental Optics and Technology, Anhui Institute of Optics and Fine Mechanics, HFIPS,Chinese Academy of Sciences, Hefei 230031, China
  • 4College of Environmental Science and Optoelectronic Technology, University of Science and Technology of China,Hefei 230026, China
  • 5Advanced Laser Technology Laboratory of Anhui Province, Hefei 230037, China
  • 6College of Physics and Materials Engineering, Hefei Normal University, Hefei 230601, China
  • 7Pipe China Institute Academy of Science & Technology, Langfang 065000, China
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    Figures & Tables(10)
    Schematic of multi-beam interference in F-P etalon
    Diagram of experimental device for wavelength monitoring by F-P etalon
    Direct modulation performance test of DFB laser: The relationship between wavelength and temperature/current
    Intensity of reflected and transmitted light during current scanning
    Light intensity ratio of interference signals (The wavelength corresponding to the black dashed lines are in the "dead zone" of the θ1 signal and the "effective zone" of the θ2 signal)
    Wavelength shift in 30 min
    Reflected light intensity, transmitted light intensity and light intensity ratio change with wavelength scanning
    Linear relationship between the results of F-P system measurements and the reference wavemeter measurements, and its regular residual
    Wavelength monitoring results of F-P system output within 10 min
    Fluctuations of wavelength at different scanning voltages
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    Yuqing LIN, Hua XIA, Zhirong ZHANG, Pengshuai SUN, Bian WU, Zhe LI, Yongjun CAI. Investigation of high‑precision real time wavelength monitoring method based on Fabry‑Perot etalon[J]. Chinese Journal of Quantum Electronics, 2025, 42(2): 187

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    Paper Information

    Category:

    Received: Mar. 15, 2023

    Accepted: --

    Published Online: Apr. 1, 2025

    The Author Email: Hua XIA (huaxia@aiofm.ac.cn), Zhirong ZHANG (zhangzr@aiofm.ac.cn)

    DOI:10.3969/j.issn.1007-5461.2025.02.004

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