Chinese Journal of Lasers, Volume. 52, Issue 11, 1104004(2025)

Multi‐Surface Interferometric Measurement and Experimental Verification Using Discontinuous Wavelength Scanning

Hao Qiu1, Bo Dong1,2, Shengli Xie1, and Yulei Bai1,2、*
Author Affiliations
  • 1School of Automation, Guangdong University of Technology, Guangzhou 510006, Guangdong , China
  • 2Key Laboratory of Inteligent Information Processing and System Integration of IoT, Ministry of Education, Guangzhou 510006, Guangdong , China
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    References(20)

    [3] Mo K, Hou X, Deng H et al. Design of multi-angle annular uniform illumination system for curved optical surface defect detection[J]. Acta Optica Sinica, 45, 0222001(2025).

    [9] Wang H S, Shi T L, Liao G L et al. Profilometer based on interferometry and micro vision system[J]. Opto-Electronic Engineering, 35, 84-89(2008).

    [11] Davila A, Huntley J M, Pallikarakis C et al. Simultaneous wavenumber measurement and coherence detection using temporal phase unwrapping[J]. Applied Optics, 51, 558-567(2012).

    [12] Zhou Y Z. Measurement of mechanical properties at the bottom of a granular pack by wavelength-scanning interferometry[D](2007).

    [19] Fan S, Guo Y R. Digital image correlation measurement based on pointwise moving least-square fitting[J]. Laser & Optoelectronics Progress, 60, 0612001(2023).

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    Hao Qiu, Bo Dong, Shengli Xie, Yulei Bai. Multi‐Surface Interferometric Measurement and Experimental Verification Using Discontinuous Wavelength Scanning[J]. Chinese Journal of Lasers, 2025, 52(11): 1104004

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    Paper Information

    Category: Measurement and metrology

    Received: Jan. 9, 2025

    Accepted: Feb. 24, 2025

    Published Online: Jun. 14, 2025

    The Author Email: Yulei Bai (yuleibai@outlook.com)

    DOI:10.3788/CJL250446

    CSTR:32183.14.CJL250446

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