[1] [1] Zhang Cunlin, Mu Kaijun. Terahertz spectroscopy and imaging［J］. Laser & Optoelectronics Progress, 2010, 47(2): 023001

[2] [2] Zhao Shusen, Chen Sijia, Shen Jingling. Identification of terahertz absorption spectra of illicit drugs using support vector machines［J］. Chinese J. Lasers, 2009, 36(3): 752～757

[3] [3] Ding Shenghui, Li Qi, Yao Rui et al.. Preliminary study on THz confocal imaging［J］. Acta Optica Sinica, 2010, 30(s1): 100402

[4] [4] Yang Kun, Zhao Guozhong, Liang Chengsen et al.. Comparison between pulse terahertz imaging and continuous-wave terahertz imaging［J］. Chinese J. Lasers, 2009, 36(11): 2853～2858

[5] [5] Zhang Liangliang, Zhang Yan, Zhong Hua et al.. Terahertz focal-plane multiwavelength phase imaging［J］. Chinese J. Lasers, 2009, 36(s): 276～279

[6] [6] S. C. Howells, L. A. Schlie. Transient terahetz reflection spectroscopy of undoped InSb from 0.1 to 1.1 THz［J］. Appl. Phys. Lett., 1996, 69(4): 550～552

[7] [7] L. Fekete, J. Y. Hlinka, F. Kadlec et al.. Active optical control of the terahertz reflectivity of high-resistivity semiconductors［J］. Opt. Lett., 2005, 30(15): 1992～1994

[8] [8] Y. Dikmelik, J. B. Spicer. Effects of surface roughness on reflection spectra obtained by terahertz time-domain spectroscopy［J］. Opt. Lett., 2006, 31(24): 3653～3655

[9] [9] L. M. Zurk, G. Sundberg, S. Schecklman et al.. Scattering effects in terahertz reflection spectroscopy［C］. SPIE, 2008, 6949: 689305

[10] [10] M. R. Leahy-Hoppa, M. J. Fitch, R. Osiander. Terahertz reflection spectroscopy for the detection of explosives［C］. SPIE, 2008, 6893: 689305

[11] [11] Li Qi, Yao Rui, Yin Qiguo et al.. Recent advance of CO2-pumped THz imaging［J］. Laser Technology, 2009, 33(2): 151～155

[12] [12] S. H. Ding, Q. Li, Y. D. Li et al.. Continuous-wave terahertz digital holography by use of a pyroelectric array camera［J］. Opt. Lett., 2011, 36(11): 1993～1995

[13] [13] Yi Hengyu, Lü Baida. The advance of techniques of reflectivity measurement［J］. Laser Technology, 2004, 28(5): 459～462

[14] [14] Gong Yuan, Li Bincheng. Continuous-wave cavity ring-down technique for accurate measurement of high reflectivity［J］. Chinese J. Lasers, 2006, 33(9): 1247～1250