Chinese Optics Letters, Volume. 19, Issue 4, 041101(2021)

Enhancement of rapid lifetime determination for time-resolved fluorescence imaging in forensic examination

Xin Zhong1,2, Xinwei Wang1,2,3、*, Liang Sun1, and Yan Zhou1,2,3
Author Affiliations
  • 1Optoelectronics System Laboratory, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083, China
  • 2College of Materials Science and Opto-Electronics Technology, University of Chinese Academy of Sciences, Beijing 100049, China
  • 3School of Electronic, Electrical and Communication Engineering, University of Chinese Academy of Sciences, Beijing 100049, China
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    Figures & Tables(5)
    (a) Schematic diagram of the wide-field TRFI system, (b) principle of the ERLD method, and (c) process diagram of the ERLD method.
    Experimental results of cross letter written by M&G and GUANGBO under different methods: (a) target picture, (b) intensity image, (c) traditional RLD image, (d) ERLD image, and (e) manual RLD image.
    Variance distribution with (a) filter threshold and (b) maximum and minimum thresholds in ERLD images.
    Results of obliterated document: (a) target picture, (b) intensity image, (c) ERLD image, and (d) manual RLD image.
    • Table 1. Different Contrast of Three Methods

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      Table 1. Different Contrast of Three Methods

       Intensity ImageERLD ImageManual RLD Image
      Fig. 20.04751.45800.8485
      Fig. 40.06672.29870.5586
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    Xin Zhong, Xinwei Wang, Liang Sun, Yan Zhou, "Enhancement of rapid lifetime determination for time-resolved fluorescence imaging in forensic examination," Chin. Opt. Lett. 19, 041101 (2021)

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    Paper Information

    Category: Imaging Systems and Image Processing

    Received: Jun. 1, 2020

    Accepted: Oct. 9, 2020

    Posted: Oct. 10, 2020

    Published Online: Jan. 8, 2021

    The Author Email: Xinwei Wang (wangxinwei@semi.ac.cn)

    DOI:10.3788/COL202119.041101

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