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Laser & Optoelectronics Progress, Volume. 55, Issue 2, 021011(2018)

Feature Extraction of Workpiece Circular Arc Contour Based on Sobel Operator

Chunjian Hua1,2, Xuemei Xiong1、*, and Ying Chen1
Author Affiliations
  • 1 School of Internet of Things Engineering, Jiangnan University, Wuxi, Jiangsu 214122, China
  • 1 School of Mechanical Engineering, Jiangnan University, Wuxi, Jiangsu 214122, China
  • 2 Jiangsu Key Laboratory of Advanced Food Manufacturing Equipment & Technology, Wuxi, Jiangsu 214122, China;
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    AbstractGet PDF(in Chinese)
    Figures&Tables (16)
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    References (17)
    Cited By (9)
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    Figures & Tables(16)
    Edge detection diagram of Sobel operator. (a) Gray-scale image and (b) edge detection of arc workpiece

    Fig. 1. Edge detection diagram of Sobel operator. (a) Gray-scale image and (b) edge detection of arc workpiece

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    Two points extracted in the gray-scale image of the workpiece

    Fig. 2. Two points extracted in the gray-scale image of the workpiece

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    Construction process of invariant feature[17]. (a) Point set; (b) convex hull of point set; (c) triangle construction

    Fig. 3. Construction process of invariant feature[17]. (a) Point set; (b) convex hull of point set; (c) triangle construction

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    Edge contour feature extraction diagram of the workpiece

    Fig. 4. Edge contour feature extraction diagram of the workpiece

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    Radius distribution histogram in polar coordinate

    Fig. 5. Radius distribution histogram in polar coordinate

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    Radius distribution in polar coordinate

    Fig. 6. Radius distribution in polar coordinate

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    Outer contour point of the arc workpiece

    Fig. 7. Outer contour point of the arc workpiece

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    Photograph of experimental setup

    Fig. 8. Photograph of experimental setup

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    Gray-scale image of the workpiece under monocular photography

    Fig. 9. Gray-scale image of the workpiece under monocular photography

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    Comparison of the extracted outer contour maps with (a) the algorithm in Ref. [12] and (b) the proposed algorithm

    Fig. 10. Comparison of the extracted outer contour maps with (a) the algorithm in Ref. [12] and (b) the proposed algorithm

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    VMSE versus L

    Fig. 11. VMSE versus L

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    Adaptive weight value β under different illumination intensities

    Fig. 12. Adaptive weight value β under different illumination intensities

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    • Table 1. MSE of the extracted outer contour points with the proposed algorithm

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      Table 1. MSE of the extracted outer contour points with the proposed algorithm

      Experimental number12345678
      VMSE1/10-31.9122.3782.6212.3711.8252.2312.0242.339

    • Table 2. MSE of the extracted inner contour points with the proposed algorithm

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      Table 2. MSE of the extracted inner contour points with the proposed algorithm

      Experimental number12345678
      VMSE2 /10-31.9422.3672.8342.3632.8562.5432.6672.023

    • Table 3. MSE of the extracted outer contour points with the algorithm in Ref. [12]

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      Table 3. MSE of the extracted outer contour points with the algorithm in Ref. [12]

      Experimental number12345678
      VMSE3 /10-33.7762.9632.9373.6413.1553.0683.3573.226

    • Table 4. MSE for outer contour points under different illumination intensities

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      Table 4. MSE for outer contour points under different illumination intensities

      AlgorithmVMSE /10-3
      L=5 lxL=20 lxL=80 lxL=150 lxL=300 lxL=500 lxL=1000 lxL=1500 lx
      Proposedalgorithm1.9121.8931.8761.9021.9331.9452.0431.896
      Algorithmin Ref. [12]3.5673.2883.0642.8732.5332.2162.3022.357
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    Chunjian Hua, Xuemei Xiong, Ying Chen. Feature Extraction of Workpiece Circular Arc Contour Based on Sobel Operator[J]. Laser & Optoelectronics Progress, 2018, 55(2): 021011

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    Paper Information

    Category: Image processing

    Received: Aug. 14, 2017

    Accepted: --

    Published Online: Sep. 10, 2018

    The Author Email: Xuemei Xiong ( 466755765@qq.com)

    DOI:10.3788/LOP55.021011

    Topics

    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology