Festing Testing Method for Modulation Transfer Function of Low-Light Level CMOS Sensor

Zhuo Tang; Jinsong Wang; Qun Niu; Xiaohua Liu

doi:10.3788/LOP231440

Laser & Optoelectronics Progress, Volume. 61, Issue 12, 1228003(2024)

Festing Testing Method for Modulation Transfer Function of Low-Light Level CMOS Sensor

Zhuo Tang¹, Jinsong Wang^1,2、*, Qun Niu¹, and Xiaohua Liu¹

Author Affiliations

¹School of Optoelectronic Engineering, Changchun University of Science and Technology, Changchun 130022, Jilin, China

²Zhongshan Institute of Changchun University of Science and Technology, Zhongshan 528437, Guangdong, China

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Figures & Tables(15)

Fig. 1. Optical system imaging process. (a) Point light source; (b) point spread function

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Fig. 2. Edge method calculation process

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Fig. 3. Edge projection process diagram

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Fig. 4. Sensor MTF test algorithm flow chart

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Fig. 5. Edge detection results of different algorithms. (a) Adaptive Canny algorithm; (b) Canny operator; (c) the traditional double threshold Canny algorithm; (d) Sobel operator

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Fig. 6. Oversampling process diagram

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Fig. 7. Comparison of ESF curve fitting methods

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Fig. 8. Low-light-level CMOS image sensor

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Fig. 9. The extracted edge subframe image

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Fig. 10. ESF curve and LSF curve

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Fig. 11. MTF curve of low-light-level CMOS sensor

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Fig. 12. Comparison of different methods

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Fig. 13. Absolute error of MTF between different test pictures and laboratory test

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Table 1. CMOS main parameter values
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Table 1. CMOS main parameter values
Parameter Numerical value
Pixel dimension /（ $μ m \times μ m$ ） $8.1 \times 8.1$
Image elements $1920 (H) \times 1080 (V)$
Frame frequency 90
Peak quantum efficiency /% 72
Digital output /bit 8

Table 2. Average MTF extracted by three methods at Nyquist frequency
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Table 2. Average MTF extracted by three methods at Nyquist frequency
Method MTF
Proposed method 0.7246
ISO12233 0.1202
Method of reference［15］ 0.6793
Method of reference［16］ 0.5016
Method of reference［17］ 0.4854
Method of reference［18］ 0.4058

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Zhuo Tang, Jinsong Wang, Qun Niu, Xiaohua Liu. Festing Testing Method for Modulation Transfer Function of Low-Light Level CMOS Sensor[J]. Laser & Optoelectronics Progress, 2024, 61(12): 1228003

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