Laser & Optoelectronics Progress, Volume. 58, Issue 11, 1123002(2021)

Enhanced Raman Scattering Based on Thickness of Oscillating Metallic Optical Waveguide

Yan Lu1,3, Xiaowen Shi1, Xiaoyan Deng1, Yumeng Tao2, Hongli Chen3、*, Jinghuai Fang3, and Chonggui Zhong3
Author Affiliations
  • 1School of Transportation Engineering, Jiangsu Shipping College, Nantong , Jiangsu 226010, China
  • 2School of Rail Transportation, Nanjing Vocational Institute of Transport Technology, Nanjing , Jiangsu 211188, China
  • 3School of Science, Nantong University, Nantong , Jiangsu 226019, China
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    Figures & Tables(9)
    Structure of oscillating metal optical waveguide
    ATR spectra of metal waveguides with TE polarization and TM polarization
    Mode distributions in waveguides with different thicknesses
    Relationship between energy and thickness in waveguide guide layer and coupling layer
    Experimental device for detecting waveguide reflectivity
    Reflection spectrum of waveguide with thickness of 1.00 mm
    Experimental device for Raman spectroscopy detection
    Raman spectra of CuPc under different waveguide thicknesses
    Raman spectra of 0.17 mm thickness waveguide with different polarization
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    Yan Lu, Xiaowen Shi, Xiaoyan Deng, Yumeng Tao, Hongli Chen, Jinghuai Fang, Chonggui Zhong. Enhanced Raman Scattering Based on Thickness of Oscillating Metallic Optical Waveguide[J]. Laser & Optoelectronics Progress, 2021, 58(11): 1123002

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    Paper Information

    Category: Optical Devices

    Received: Nov. 2, 2020

    Accepted: Dec. 3, 2020

    Published Online: Jun. 7, 2021

    The Author Email: Hongli Chen (chenhongli@ntu.edu.cn)

    DOI:10.3788/LOP202158.1123002

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